Beyond the Debye length and ideal Nernst sensitivity for FET sensors: From fundamental breakthrough to practical applications for mobile diagnostics and personal healthcare

演講日期：109年12月7日(一)下午2時20分開始

演講者：王玉麟教授(清華大學動力機械工程學系 奈米工程與微系統研究所)

題目：Beyond the Debye length and ideal Nernst sensitivity for FET sensors: From fundamental breakthrough to practical applications for mobile diagnostics and personal healthcare

地點：應力館國際會議廳

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